Scanning Electron Microscopy (SEM) Characterization & Testing
Scanning Electron Microscopy (SEM) Characterization & Testing – Scanning electron microscopy, SEM for short, is a great way to obtain information about a sample’s surface topography and composition in industries such as microelectronics, semiconductor, medical devices, general manufacturing, insurance and litigation support, R&D, and food processing.
Benefits of SEM testing include:
• Digital image resolution as low as 15 nanometers
• Magnification for all imaging is calibrated to a traceable standard. Image analysis for coating thicknesses, grain size determinations and particle sizing can be applied to the saved images.
• Qualitative elemental analysis, standardless quantitative analysis, x-ray line scans and mapping can be performed on both of the SEM systems.
Contact our experienced analysts to discuss your individual scanning electron microscopy (sem) needs. For more information, read more below about how SEM/EDS works and the three different types of systems.
To learn more, check out our comparison of VPSEM and FESEM applications
You are always welcome to contact our experienced analysts to discuss your specific analytics needs.